In modern society, intelligent devices equipped with flash memory are very popular. It has many wonderful characteristics, such as small, fast, little consumption, shock resistance and so on. Flash memory is divided into NOR memory and NAND memory. The NOR memory can be quickly read with byte data which is developed into data memory for code storage. A new algorithm is needed to optimize the performance of the flash memory. In this paper, we propose a new strategy for replacement to focus on reducing the execution time of the replacement cost and I / O, which is to improve the performance of the algorithm performance. Trace-driven method has a better performance than the existing algorithms in terms of cost and execution time.
Published in | Journal of Electrical and Electronic Engineering (Volume 4, Issue 3) |
DOI | 10.11648/j.jeee.20160403.16 |
Page(s) | 73-77 |
Creative Commons |
This is an Open Access article, distributed under the terms of the Creative Commons Attribution 4.0 International License (http://creativecommons.org/licenses/by/4.0/), which permits unrestricted use, distribution and reproduction in any medium or format, provided the original work is properly cited. |
Copyright |
Copyright © The Author(s), 2016. Published by Science Publishing Group |
Page Replacement Algorithms, NAND Flash Memory, Embedded Systems
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APA Style
Hai Jun Zhang, Wan Jun Yu. (2016). Page Replacement Algorithm for NAND Flash Used in Mobile Devices. Journal of Electrical and Electronic Engineering, 4(3), 73-77. https://doi.org/10.11648/j.jeee.20160403.16
ACS Style
Hai Jun Zhang; Wan Jun Yu. Page Replacement Algorithm for NAND Flash Used in Mobile Devices. J. Electr. Electron. Eng. 2016, 4(3), 73-77. doi: 10.11648/j.jeee.20160403.16
AMA Style
Hai Jun Zhang, Wan Jun Yu. Page Replacement Algorithm for NAND Flash Used in Mobile Devices. J Electr Electron Eng. 2016;4(3):73-77. doi: 10.11648/j.jeee.20160403.16
@article{10.11648/j.jeee.20160403.16, author = {Hai Jun Zhang and Wan Jun Yu}, title = {Page Replacement Algorithm for NAND Flash Used in Mobile Devices}, journal = {Journal of Electrical and Electronic Engineering}, volume = {4}, number = {3}, pages = {73-77}, doi = {10.11648/j.jeee.20160403.16}, url = {https://doi.org/10.11648/j.jeee.20160403.16}, eprint = {https://article.sciencepublishinggroup.com/pdf/10.11648.j.jeee.20160403.16}, abstract = {In modern society, intelligent devices equipped with flash memory are very popular. It has many wonderful characteristics, such as small, fast, little consumption, shock resistance and so on. Flash memory is divided into NOR memory and NAND memory. The NOR memory can be quickly read with byte data which is developed into data memory for code storage. A new algorithm is needed to optimize the performance of the flash memory. In this paper, we propose a new strategy for replacement to focus on reducing the execution time of the replacement cost and I / O, which is to improve the performance of the algorithm performance. Trace-driven method has a better performance than the existing algorithms in terms of cost and execution time.}, year = {2016} }
TY - JOUR T1 - Page Replacement Algorithm for NAND Flash Used in Mobile Devices AU - Hai Jun Zhang AU - Wan Jun Yu Y1 - 2016/06/17 PY - 2016 N1 - https://doi.org/10.11648/j.jeee.20160403.16 DO - 10.11648/j.jeee.20160403.16 T2 - Journal of Electrical and Electronic Engineering JF - Journal of Electrical and Electronic Engineering JO - Journal of Electrical and Electronic Engineering SP - 73 EP - 77 PB - Science Publishing Group SN - 2329-1605 UR - https://doi.org/10.11648/j.jeee.20160403.16 AB - In modern society, intelligent devices equipped with flash memory are very popular. It has many wonderful characteristics, such as small, fast, little consumption, shock resistance and so on. Flash memory is divided into NOR memory and NAND memory. The NOR memory can be quickly read with byte data which is developed into data memory for code storage. A new algorithm is needed to optimize the performance of the flash memory. In this paper, we propose a new strategy for replacement to focus on reducing the execution time of the replacement cost and I / O, which is to improve the performance of the algorithm performance. Trace-driven method has a better performance than the existing algorithms in terms of cost and execution time. VL - 4 IS - 3 ER -