Physical Properties of Copper Oxide Thin Films Prepared by Sol–Gel Spin–Coating Method

Mehdi Dhaouadi; Mohamed Jlassi; Imen Sta; Islem Ben Miled; George Mousdis; Michael Kompitsas; Wissem Dimassi

doi:doi:10.11648/j.ajpa.20180602.13

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Physical Properties of Copper Oxide Thin Films Prepared by Sol–Gel Spin–Coating Method

Mehdi Dhaouadi, Mohamed Jlassi, Imen Sta, Islem Ben Miled, George Mousdis, Michael Kompitsas, Wissem Dimassi

Published in American Journal of Physics and Applications (Volume 6, Issue 2)

Received: 26 November 2017 Accepted: 5 December 2017 Published: 29 January 2018

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Abstract

In this study, copper oxide thin films prepared by the sol–gel method, have been deposed onto glass substrates by the spin coating technique. Our target was to study their properties and improve them for photovoltaic use. These properties were optimized by varying the temperature annealing and the molar concentration of the precursor solutions. The effects of the annealing temperature on the structural and optical properties of the thin films are studied. It was found that the film treated at 550°C shows a higher absorbance. Then by using this optimized temperature, CuO thin films of various molar concentrations, were deposited at the same experimental conditions. The structural analysis by X- ray diffraction (XRD) shows that all the samples are polycrystalline with monoclinic crystal structure. Raman scattering measurements of all thin films confirms the structure of CuO. The optical properties of the films were characterized by UV–Visible–NIR spectrophotometry, which shows that the films show high absorbance in the visible region. Their optical band gap decreases from 3.68 to 2.44 eV when the molar concentration of precursor solutions increases from 0.1 to 0.5 M. The electrical measurements show that the resistivity of the films varies slightly from 84 Ω cm to 124 Ω cm as the molar concentration increases.

Published in	American Journal of Physics and Applications (Volume 6, Issue 2)
DOI	10.11648/j.ajpa.20180602.13
Page(s)	43-50
Creative Commons	This is an Open Access article, distributed under the terms of the Creative Commons Attribution 4.0 International License (http://creativecommons.org/licenses/by/4.0/), which permits unrestricted use, distribution and reproduction in any medium or format, provided the original work is properly cited.
Copyright	Copyright © The Author(s), 2018. Published by Science Publishing Group

Keywords

Sol–Gel, Spin-Coating, Copper Oxide, Thin Films, Physical Properties

References

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APA Style

Mehdi Dhaouadi, Mohamed Jlassi, Imen Sta, Islem Ben Miled, George Mousdis, et al. (2018). Physical Properties of Copper Oxide Thin Films Prepared by Sol–Gel Spin–Coating Method. American Journal of Physics and Applications, 6(2), 43-50. https://doi.org/10.11648/j.ajpa.20180602.13

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ACS Style

Mehdi Dhaouadi; Mohamed Jlassi; Imen Sta; Islem Ben Miled; George Mousdis, et al. Physical Properties of Copper Oxide Thin Films Prepared by Sol–Gel Spin–Coating Method. Am. J. Phys. Appl. 2018, 6(2), 43-50. doi: 10.11648/j.ajpa.20180602.13

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AMA Style

Mehdi Dhaouadi, Mohamed Jlassi, Imen Sta, Islem Ben Miled, George Mousdis, et al. Physical Properties of Copper Oxide Thin Films Prepared by Sol–Gel Spin–Coating Method. Am J Phys Appl. 2018;6(2):43-50. doi: 10.11648/j.ajpa.20180602.13

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@article{10.11648/j.ajpa.20180602.13,
  author = {Mehdi Dhaouadi and Mohamed Jlassi and Imen Sta and Islem Ben Miled and George Mousdis and Michael Kompitsas and Wissem Dimassi},
  title = {Physical Properties of Copper Oxide Thin Films Prepared by Sol–Gel Spin–Coating Method},
  journal = {American Journal of Physics and Applications},
  volume = {6},
  number = {2},
  pages = {43-50},
  doi = {10.11648/j.ajpa.20180602.13},
  url = {https://doi.org/10.11648/j.ajpa.20180602.13},
  eprint = {https://article.sciencepublishinggroup.com/pdf/10.11648.j.ajpa.20180602.13},
  abstract = {In this study, copper oxide thin films prepared by the sol–gel method, have been deposed onto glass substrates by the spin coating technique. Our target was to study their properties and improve them for photovoltaic use. These properties were optimized by varying the temperature annealing and the molar concentration of the precursor solutions. The effects of the annealing temperature on the structural and optical properties of the thin films are studied. It was found that the film treated at 550°C shows a higher absorbance. Then by using this optimized temperature, CuO thin films of various molar concentrations, were deposited at the same experimental conditions. The structural analysis by X- ray diffraction (XRD) shows that all the samples are polycrystalline with monoclinic crystal structure. Raman scattering measurements of all thin films confirms the structure of CuO. The optical properties of the films were characterized by UV–Visible–NIR spectrophotometry, which shows that the films show high absorbance in the visible region. Their optical band gap decreases from 3.68 to 2.44 eV when the molar concentration of precursor solutions increases from 0.1 to 0.5 M. The electrical measurements show that the resistivity of the films varies slightly from 84 Ω cm to 124 Ω cm as the molar concentration increases.},
 year = {2018}
}

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TY - JOUR
T1 - Physical Properties of Copper Oxide Thin Films Prepared by Sol–Gel Spin–Coating Method
AU - Mehdi Dhaouadi
AU - Mohamed Jlassi
AU - Imen Sta
AU - Islem Ben Miled
AU - George Mousdis
AU - Michael Kompitsas
AU - Wissem Dimassi
Y1 - 2018/01/29
PY - 2018
N1 - https://doi.org/10.11648/j.ajpa.20180602.13
DO - 10.11648/j.ajpa.20180602.13
T2 - American Journal of Physics and Applications
JF - American Journal of Physics and Applications
JO - American Journal of Physics and Applications
SP - 43
EP - 50
PB - Science Publishing Group
SN - 2330-4308
UR - https://doi.org/10.11648/j.ajpa.20180602.13
AB - In this study, copper oxide thin films prepared by the sol–gel method, have been deposed onto glass substrates by the spin coating technique. Our target was to study their properties and improve them for photovoltaic use. These properties were optimized by varying the temperature annealing and the molar concentration of the precursor solutions. The effects of the annealing temperature on the structural and optical properties of the thin films are studied. It was found that the film treated at 550°C shows a higher absorbance. Then by using this optimized temperature, CuO thin films of various molar concentrations, were deposited at the same experimental conditions. The structural analysis by X- ray diffraction (XRD) shows that all the samples are polycrystalline with monoclinic crystal structure. Raman scattering measurements of all thin films confirms the structure of CuO. The optical properties of the films were characterized by UV–Visible–NIR spectrophotometry, which shows that the films show high absorbance in the visible region. Their optical band gap decreases from 3.68 to 2.44 eV when the molar concentration of precursor solutions increases from 0.1 to 0.5 M. The electrical measurements show that the resistivity of the films varies slightly from 84 Ω cm to 124 Ω cm as the molar concentration increases.
VL - 6
IS - 2
ER -

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Author Information

Mehdi Dhaouadi

Department of Physics, Photovoltaic Laboratory, Research and Technology Centre of Energy, Borj-Cedria Science and Technology Park, Hammam-Lif, Tunisia
Mohamed Jlassi

Department of Physics, Higher School of Science and Technology of Design, University of Manouba, Tunis, Tunisia
Imen Sta

Department of Physics, Photovoltaic Laboratory, Research and Technology Centre of Energy, Borj-Cedria Science and Technology Park, Hammam-Lif, Tunisia
Islem Ben Miled

Department of Physics, Photovoltaic Laboratory, Research and Technology Centre of Energy, Borj-Cedria Science and Technology Park, Hammam-Lif, Tunisia
George Mousdis

Department of Physics, National Hellenic Research Foundation, Theoretical and Physical Chemistry Institute, Athens, Greece
Michael Kompitsas

Department of Physics, National Hellenic Research Foundation, Theoretical and Physical Chemistry Institute, Athens, Greece
Wissem Dimassi

Department of Physics, Photovoltaic Laboratory, Research and Technology Centre of Energy, Borj-Cedria Science and Technology Park, Hammam-Lif, Tunisia

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APA Style

Mehdi Dhaouadi, Mohamed Jlassi, Imen Sta, Islem Ben Miled, George Mousdis, et al. (2018). Physical Properties of Copper Oxide Thin Films Prepared by Sol–Gel Spin–Coating Method. American Journal of Physics and Applications, 6(2), 43-50. https://doi.org/10.11648/j.ajpa.20180602.13

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ACS Style

Mehdi Dhaouadi; Mohamed Jlassi; Imen Sta; Islem Ben Miled; George Mousdis, et al. Physical Properties of Copper Oxide Thin Films Prepared by Sol–Gel Spin–Coating Method. Am. J. Phys. Appl. 2018, 6(2), 43-50. doi: 10.11648/j.ajpa.20180602.13

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AMA Style

Mehdi Dhaouadi, Mohamed Jlassi, Imen Sta, Islem Ben Miled, George Mousdis, et al. Physical Properties of Copper Oxide Thin Films Prepared by Sol–Gel Spin–Coating Method. Am J Phys Appl. 2018;6(2):43-50. doi: 10.11648/j.ajpa.20180602.13

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@article{10.11648/j.ajpa.20180602.13,
  author = {Mehdi Dhaouadi and Mohamed Jlassi and Imen Sta and Islem Ben Miled and George Mousdis and Michael Kompitsas and Wissem Dimassi},
  title = {Physical Properties of Copper Oxide Thin Films Prepared by Sol–Gel Spin–Coating Method},
  journal = {American Journal of Physics and Applications},
  volume = {6},
  number = {2},
  pages = {43-50},
  doi = {10.11648/j.ajpa.20180602.13},
  url = {https://doi.org/10.11648/j.ajpa.20180602.13},
  eprint = {https://article.sciencepublishinggroup.com/pdf/10.11648.j.ajpa.20180602.13},
  abstract = {In this study, copper oxide thin films prepared by the sol–gel method, have been deposed onto glass substrates by the spin coating technique. Our target was to study their properties and improve them for photovoltaic use. These properties were optimized by varying the temperature annealing and the molar concentration of the precursor solutions. The effects of the annealing temperature on the structural and optical properties of the thin films are studied. It was found that the film treated at 550°C shows a higher absorbance. Then by using this optimized temperature, CuO thin films of various molar concentrations, were deposited at the same experimental conditions. The structural analysis by X- ray diffraction (XRD) shows that all the samples are polycrystalline with monoclinic crystal structure. Raman scattering measurements of all thin films confirms the structure of CuO. The optical properties of the films were characterized by UV–Visible–NIR spectrophotometry, which shows that the films show high absorbance in the visible region. Their optical band gap decreases from 3.68 to 2.44 eV when the molar concentration of precursor solutions increases from 0.1 to 0.5 M. The electrical measurements show that the resistivity of the films varies slightly from 84 Ω cm to 124 Ω cm as the molar concentration increases.},
 year = {2018}
}

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