The dark bridge in loose electrical contacts was investigated, which grew up when the contact gap was increased a little with micron by micron. The dark bridge was watched by microscopic camera along with measurement of voltage-current (V-I) relationship. At very small gap (less than 19μm for iron (Fe) contacts but different from materials), the V-I characteristics were linear, which is normal, but more than the 20~30μm, the non-linear relationship appeared and finally the negative resistance was observed. Experimental growth of dark bridge was shown in case of Pd. The nonlinear and negative resistance phenomena were tested for Fe. The resistance was analyzed and showed that it goes to negative one after crossing zero from positive region.
| Published in | American Journal of Physics and Applications (Volume 1, Issue 1) |
| DOI | 10.11648/j.ajpa.20130101.11 |
| Page(s) | 1-4 |
| Creative Commons |
This is an Open Access article, distributed under the terms of the Creative Commons Attribution 4.0 International License (http://creativecommons.org/licenses/by/4.0/), which permits unrestricted use, distribution and reproduction in any medium or format, provided the original work is properly cited. |
| Copyright |
Copyright © The Author(s), 2013. Published by Science Publishing Group |
Electrical Contacts, Dark Bridge, Nonlinear, Exponential, Negative Resistance
| [1] | Hiroyuki Ishida, Masanari Taniguchi, Tasuku Takagi, "Precise Measurement of Dark Bridge between Micro-gap Electrical Contacts in a State of Thermal Equilibrium Condition", Proc. of the IEEE IMTC 2005, Ottawa Canada May 2005. |
| [2] | Hiroyuki Ishida, Masanari Taniguchi, Hideaki Sone, Hiroshi Inoue, Tasuku Takagi, "Relationship between Length and Diameter of Contact Bridge Formed under Thermal Equliburium Condition", IEICE Transactions on Electronics, Vol. E88-C ,No.8, 2005 |
| [3] | Hiromichi Kubota, Masanari Taniguchi, Shosuke Suzuki, Tasuku Takagi, "Contact Failure and Thermal Deformation Analysis of Printed Circuit Board Connector Due to Thermal Stress by Using Holography,", Proceedings of the ICEC2008 Saint-Malo-France, 2008 |
| [4] | TAKAGI Tasuku, "Noise properties in breaking and loose contacts and their effect on quality degradation of digital signal", Journal of Zhenjiang University SCIENCE A 2007 8(3):357-360 |
| [5] | R.Holm, Electric Contacts: theory and applications,p.11~16, Springer-Verlag, Berlin 2000 |
APA Style
Hiromichi Kubota, Shunsuke Sasaki, Hiroyuki Ishida, Tasuku Takagi. (2013). Nonlinear and Negative Resistance in Loose Electrical Contacts Dark Bridge. American Journal of Physics and Applications, 1(1), 1-4. https://doi.org/10.11648/j.ajpa.20130101.11
ACS Style
Hiromichi Kubota; Shunsuke Sasaki; Hiroyuki Ishida; Tasuku Takagi. Nonlinear and Negative Resistance in Loose Electrical Contacts Dark Bridge. Am. J. Phys. Appl. 2013, 1(1), 1-4. doi: 10.11648/j.ajpa.20130101.11
AMA Style
Hiromichi Kubota, Shunsuke Sasaki, Hiroyuki Ishida, Tasuku Takagi. Nonlinear and Negative Resistance in Loose Electrical Contacts Dark Bridge. Am J Phys Appl. 2013;1(1):1-4. doi: 10.11648/j.ajpa.20130101.11
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Download@article{10.11648/j.ajpa.20130101.11,
author = {Hiromichi Kubota and Shunsuke Sasaki and Hiroyuki Ishida and Tasuku Takagi},
title = {Nonlinear and Negative Resistance in Loose Electrical Contacts Dark Bridge},
journal = {American Journal of Physics and Applications},
volume = {1},
number = {1},
pages = {1-4},
doi = {10.11648/j.ajpa.20130101.11},
url = {https://doi.org/10.11648/j.ajpa.20130101.11},
eprint = {https://article.sciencepublishinggroup.com/pdf/10.11648.j.ajpa.20130101.11},
abstract = {The dark bridge in loose electrical contacts was investigated, which grew up when the contact gap was increased a little with micron by micron. The dark bridge was watched by microscopic camera along with measurement of voltage-current (V-I) relationship. At very small gap (less than 19μm for iron (Fe) contacts but different from materials), the V-I characteristics were linear, which is normal, but more than the 20~30μm, the non-linear relationship appeared and finally the negative resistance was observed. Experimental growth of dark bridge was shown in case of Pd. The nonlinear and negative resistance phenomena were tested for Fe. The resistance was analyzed and showed that it goes to negative one after crossing zero from positive region.},
year = {2013}
}
TY - JOUR T1 - Nonlinear and Negative Resistance in Loose Electrical Contacts Dark Bridge AU - Hiromichi Kubota AU - Shunsuke Sasaki AU - Hiroyuki Ishida AU - Tasuku Takagi Y1 - 2013/06/10 PY - 2013 N1 - https://doi.org/10.11648/j.ajpa.20130101.11 DO - 10.11648/j.ajpa.20130101.11 T2 - American Journal of Physics and Applications JF - American Journal of Physics and Applications JO - American Journal of Physics and Applications SP - 1 EP - 4 PB - Science Publishing Group SN - 2330-4308 UR - https://doi.org/10.11648/j.ajpa.20130101.11 AB - The dark bridge in loose electrical contacts was investigated, which grew up when the contact gap was increased a little with micron by micron. The dark bridge was watched by microscopic camera along with measurement of voltage-current (V-I) relationship. At very small gap (less than 19μm for iron (Fe) contacts but different from materials), the V-I characteristics were linear, which is normal, but more than the 20~30μm, the non-linear relationship appeared and finally the negative resistance was observed. Experimental growth of dark bridge was shown in case of Pd. The nonlinear and negative resistance phenomena were tested for Fe. The resistance was analyzed and showed that it goes to negative one after crossing zero from positive region. VL - 1 IS - 1 ER -
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